EXALOS is also offering high-performance driver boards for SLEDs (EBD) featuring ultra-low-noise and ultra-high current stability with zero long-term drift. EXALOS is also a key supplier of high-speed swept sources (ESS), for wavelength ranges from 800 to 1600 nm, and of ultra-low-noise balanced receivers (EBR).
O ptical coherence tomography has also been applied to several non-medical applications where accurate surface or thickness measurements are required in a non-invasive non-contact manner , . For example, OCT allows for performing non-contact thickness measurements of multilayer coating stacks with a clear differentiation of all layers and their thicknesses.
OCT is especially suitable when real-time thickness measurements and monitoring are required, for example, as quality assurance tools in the optical industry. Such profilometry systems can be either time-domain or spectral-domain OCT systems and are comprised of an optical interferometer that is operated with a broadband SLED light source.
Typically, long-wavelength time-domain profilometry systems use EXALOS’ high- power and ultra-broadband SLEDs with optical bandwidths of 80 to 100 nm and output powers of 10 to 20 mW (EXS210045 and EXS210046, ), corresponding to a coherence length of 9 microns in air. Spectral-domain profilometry systems are using EXALOS’ broadband SLEDs in the 800 to 900-nm wavelength range.
Next-generation profilometry systems may also use swept sources with fast scan rates of 100-200 kHz, allowing for even faster and more accurate thickness measurements.